Journal article
Data in Brief, vol. 21, 2018, pp. 18-24
APA
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Ahmed, T., Walia, S., Mayes, E. L., Ramanathan, R., Guagliardo, P., Bansal, V., … Sriram, S. (2018). Data related to the nanoscale structural and compositional evolution in resistance change memories. Data in Brief, 21, 18–24. https://doi.org/10.1016/j.dib.2018.09.087
Chicago/Turabian
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Ahmed, T., S. Walia, E. L. Mayes, R. Ramanathan, P. Guagliardo, V. Bansal, M. Bhaskaran, J. J. Yang, and S. Sriram. “Data Related to the Nanoscale Structural and Compositional Evolution in Resistance Change Memories.” Data in Brief 21 (2018): 18–24.
MLA
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Ahmed, T., et al. “Data Related to the Nanoscale Structural and Compositional Evolution in Resistance Change Memories.” Data in Brief, vol. 21, 2018, pp. 18–24, doi:10.1016/j.dib.2018.09.087.
BibTeX Click to copy
@article{t2018a,
title = {Data related to the nanoscale structural and compositional evolution in resistance change memories},
year = {2018},
journal = {Data in Brief},
pages = {18-24},
volume = {21},
doi = {10.1016/j.dib.2018.09.087},
author = {Ahmed, T. and Walia, S. and Mayes, E. L. and Ramanathan, R. and Guagliardo, P. and Bansal, V. and Bhaskaran, M. and Yang, J. J. and Sriram, S.}
}